BibTeX record conf/isqed/SultanFSvMPHCKCMTCHKAGHWBBIA09

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@inproceedings{DBLP:conf/isqed/SultanFSvMPHCKCMTCHKAGHWBBIA09,
  author    = {Akif Sultan and
               John Faricelli and
               Sushant Suryagandh and
               Hans vanMeer and
               Kaveri Mathur and
               James Pattison and
               Sean Hannon and
               Greg Constant and
               Kalyana Kumar and
               Kevin Carrejo and
               Joe Meier and
               Rasit Onur Topaloglu and
               Darin Chan and
               Uwe Hahn and
               Thorsten Knopp and
               Victor Andrade and
               Bill Gardiol and
               Steve Hejl and
               David Wu and
               James Buller and
               Larry Bair and
               Ali Icel and
               Yuri Apanovich},
  title     = {{CAD} utilities to comprehend layout-dependent stress effects in 45
               nm high- performance {SOI} custom macro design},
  booktitle = {10th International Symposium on Quality of Electronic Design {(ISQED}
               2009), 16-18 March 2009, San Jose, CA, {USA}},
  pages     = {442--446},
  year      = {2009},
  crossref  = {DBLP:conf/isqed/2009},
  url       = {https://doi.org/10.1109/ISQED.2009.4810335},
  doi       = {10.1109/ISQED.2009.4810335},
  timestamp = {Thu, 15 Jun 2017 21:41:47 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/SultanFSvMPHCKCMTCHKAGHWBBIA09},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/isqed/2009,
  title     = {10th International Symposium on Quality of Electronic Design {(ISQED}
               2009), 16-18 March 2009, San Jose, CA, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2009},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4804412},
  isbn      = {978-1-4244-2952-3},
  timestamp = {Fri, 26 Sep 2014 14:08:23 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/2009},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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