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BibTeX record conf/isqed/TandonSIA12
@inproceedings{DBLP:conf/isqed/TandonSIA12, author = {James S. Tandon and Masahiro Sasaki and Makoto Ikeda and Kunihiro Asada}, editor = {Keith A. Bowman and Kamesh V. Gadepally and Pallab Chatterjee and Mark M. Budnik and Lalitha Immaneni}, title = {A design-for-test apparatus for measuring on-chip temperature with fine granularity}, booktitle = {Thirteenth International Symposium on Quality Electronic Design, {ISQED} 2012, Santa Clara, CA, USA, March 19-21, 2012}, pages = {27--32}, publisher = {{IEEE}}, year = {2012}, url = {https://doi.org/10.1109/ISQED.2012.6187470}, doi = {10.1109/ISQED.2012.6187470}, timestamp = {Wed, 16 Oct 2019 14:14:55 +0200}, biburl = {https://dblp.org/rec/conf/isqed/TandonSIA12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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