BibTeX record conf/isqed/YeC16

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@inproceedings{DBLP:conf/isqed/YeC16,
  author       = {Tianhong Ye and
                  Kuan W. A. Chee},
  title        = {Ruggedness evaluation and design improvement of automotive power MOSFETs},
  booktitle    = {17th International Symposium on Quality Electronic Design, {ISQED}
                  2016, Santa Clara, CA, USA, March 15-16, 2016},
  pages        = {211--214},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ISQED.2016.7479202},
  doi          = {10.1109/ISQED.2016.7479202},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/isqed/YeC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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