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BibTeX record conf/isqed/Zarkesh-HaLDLW03
@inproceedings{DBLP:conf/isqed/Zarkesh-HaLDLW03, author = {Payman Zarkesh{-}Ha and S. Lakshminarayann and Ken Doniger and William Loh and Peter Wright}, title = {Impact of Interconnect Pattern Density Information on a 90nm Technology {ASIC} Design Flow}, booktitle = {4th International Symposium on Quality of Electronic Design {(ISQED} 2003), 24-26 March 2003, San Jose, CA, {USA}}, pages = {405--409}, publisher = {{IEEE} Computer Society}, year = {2003}, url = {https://doi.org/10.1109/ISQED.2003.1194767}, doi = {10.1109/ISQED.2003.1194767}, timestamp = {Thu, 23 Mar 2023 23:58:32 +0100}, biburl = {https://dblp.org/rec/conf/isqed/Zarkesh-HaLDLW03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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