BibTeX record conf/isscc/DaitoNSGKKIIKTS10

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@inproceedings{DBLP:conf/isscc/DaitoNSGKKIIKTS10,
  author       = {Mutsuo Daito and
                  Yoshiro Nakata and
                  Satoshi Sasaki and
                  Hiroyuki Gomyo and
                  Hideki Kusamitsu and
                  Yoshio Komoto and
                  Kunihiko Iizuka and
                  Katsuyuki Ikeuchi and
                  Gil{-}Su Kim and
                  Makoto Takamiya and
                  Takayasu Sakurai},
  title        = {Capacitively coupled non-contact probing circuits for membrane-based
                  wafer-level simultaneous testing},
  booktitle    = {{IEEE} International Solid-State Circuits Conference, {ISSCC} 2010,
                  Digest of Technical Papers, San Francisco, CA, USA, 7-11 February,
                  2010},
  pages        = {144--145},
  publisher    = {{IEEE}},
  year         = {2010},
  url          = {https://doi.org/10.1109/ISSCC.2010.5434018},
  doi          = {10.1109/ISSCC.2010.5434018},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/isscc/DaitoNSGKKIIKTS10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}