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BibTeX record conf/issre/UreshinoNYNA18
@inproceedings{DBLP:conf/issre/UreshinoNYNA18, author = {Aya Ureshino and Yasuharu Nishi and Satomi Yoshizawa and Makoto Nonaka and Makiko Asai}, editor = {Sudipto Ghosh and Roberto Natella and Bojan Cukic and Robin S. Poston and Nuno Laranjeiro}, title = {Trap-Based Software Review: How Will Engineers Embed Bugs Due to Cognitive Error?}, booktitle = {2018 {IEEE} International Symposium on Software Reliability Engineering Workshops, {ISSRE} Workshops, Memphis, TN, USA, October 15-18, 2018}, pages = {6--11}, publisher = {{IEEE} Computer Society}, year = {2018}, url = {https://doi.org/10.1109/ISSREW.2018.00-39}, doi = {10.1109/ISSREW.2018.00-39}, timestamp = {Wed, 26 Jun 2024 17:26:37 +0200}, biburl = {https://dblp.org/rec/conf/issre/UreshinoNYNA18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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