BibTeX record conf/isvlsi/KouR14

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@inproceedings{DBLP:conf/isvlsi/KouR14,
  author       = {Lingbo Kou and
                  William H. Robinson},
  title        = {Impact of Process Variations on Reliability and Performance of 32-nm
                  6T {SRAM} at Near Threshold Voltage},
  booktitle    = {{IEEE} Computer Society Annual Symposium on VLSI, {ISVLSI} 2014, Tampa,
                  FL, USA, July 9-11, 2014},
  pages        = {214--219},
  publisher    = {{IEEE} Computer Society},
  year         = {2014},
  url          = {https://doi.org/10.1109/ISVLSI.2014.73},
  doi          = {10.1109/ISVLSI.2014.73},
  timestamp    = {Fri, 24 Mar 2023 00:02:42 +0100},
  biburl       = {https://dblp.org/rec/conf/isvlsi/KouR14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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