BibTeX record conf/isvlsi/ShiFDGHS05

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@inproceedings{DBLP:conf/isvlsi/ShiFDGHS05,
  author       = {Junhao Shi and
                  G{\"{o}}rschwin Fey and
                  Rolf Drechsler and
                  Andreas Glowatz and
                  Friedrich Hapke and
                  J{\"{u}}rgen Schl{\"{o}}ffel},
  title        = {{PASSAT:} Efficient SAT-Based Test Pattern Generation for Industrial
                  Circuits},
  booktitle    = {2005 {IEEE} Computer Society Annual Symposium on {VLSI} {(ISVLSI}
                  2005), New Frontiers in {VLSI} Design, 11-12 May 2005, Tampa, FL,
                  {USA}},
  pages        = {212--217},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/ISVLSI.2005.55},
  doi          = {10.1109/ISVLSI.2005.55},
  timestamp    = {Fri, 24 Mar 2023 00:02:41 +0100},
  biburl       = {https://dblp.org/rec/conf/isvlsi/ShiFDGHS05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}