BibTeX record conf/itc/FanCFVBZK06

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@inproceedings{DBLP:conf/itc/FanCFVBZK06,
  author       = {Yongquan Fan and
                  Yi Cai and
                  Liming Fang and
                  Anant Verma and
                  William Burchanowski and
                  Zeljko Zilic and
                  Sandeep Kumar},
  editor       = {Scott Davidson and
                  Anne Gattiker},
  title        = {An Accelerated Jitter Tolerance Test Technique on Ate for 1.5GB/S
                  and 3GB/S Serial-ATA},
  booktitle    = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
                  CA, USA, October 22-27, 2006},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/TEST.2006.297721},
  doi          = {10.1109/TEST.2006.297721},
  timestamp    = {Tue, 12 Dec 2023 09:46:27 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/FanCFVBZK06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}