BibTeX record conf/itc/HaoM91

download as .bib file

@inproceedings{DBLP:conf/itc/HaoM91,
  author       = {Hong Hao and
                  Edward J. McCluskey},
  title        = {"Resistive Shorts" Within {CMOS} Gates},
  booktitle    = {Proceedings {IEEE} International Test Conference 1991, Test: Faster,
                  Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
  pages        = {292--301},
  publisher    = {{IEEE} Computer Society},
  year         = {1991},
  url          = {https://doi.org/10.1109/TEST.1991.519521},
  doi          = {10.1109/TEST.1991.519521},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/HaoM91.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.