BibTeX record conf/itc/HetheringtonSBP95

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@inproceedings{DBLP:conf/itc/HetheringtonSBP95,
  author       = {Graham Hetherington and
                  Greg Sutton and
                  Kenneth M. Butler and
                  Theo J. Powell},
  title        = {Test Generation and Design for Test for a Large Multiprocessing {DSP}},
  booktitle    = {Proceedings {IEEE} International Test Conference 1995, Driving Down
                  the Cost of Test, Washington, DC, USA, October 21-25, 1995},
  pages        = {149--156},
  publisher    = {{IEEE} Computer Society},
  year         = {1995},
  url          = {https://doi.org/10.1109/TEST.1995.529828},
  doi          = {10.1109/TEST.1995.529828},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HetheringtonSBP95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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