BibTeX record conf/itc/Keezer95

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@inproceedings{DBLP:conf/itc/Keezer95,
  author       = {David C. Keezer},
  title        = {Electrical Troubleshooting, Diagnostics, and Repair of Multichip Modules},
  booktitle    = {Proceedings {IEEE} International Test Conference 1995, Driving Down
                  the Cost of Test, Washington, DC, USA, October 21-25, 1995},
  pages        = {917},
  publisher    = {{IEEE} Computer Society},
  year         = {1995},
  url          = {https://doi.org/10.1109/TEST.1995.529926},
  doi          = {10.1109/TEST.1995.529926},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Keezer95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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