BibTeX record conf/itc/LiJLXC16

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@inproceedings{DBLP:conf/itc/LiJLXC16,
  author       = {Tianjian Li and
                  Li Jiang and
                  Xiaoyao Liang and
                  Qiang Xu and
                  Krishnendu Chakrabarty},
  title        = {Defect tolerance for CNFET-based SRAMs},
  booktitle    = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
                  TX, USA, November 15-17, 2016},
  pages        = {1--9},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/TEST.2016.7805833},
  doi          = {10.1109/TEST.2016.7805833},
  timestamp    = {Tue, 21 Mar 2023 21:02:05 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/LiJLXC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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