BibTeX record conf/itc/LiYHWTHC03

• > Home > conf/itc/LiYHWTHC03

@inproceedings{DBLP:conf/itc/LiYHWTHC03,
  author       = {Jin{-}Fu Li and
                  Jen{-}Chieh Yeh and
                  Rei{-}Fu Huang and
                  Cheng{-}Wen Wu and
                  Peir{-}Yuan Tsai and
                  Archer Hsu and
                  Eugene Chow},
  title        = {A Built-In Self-Repair Scheme for Semiconductor Memories with 2-D
                  Redundancy},
  booktitle    = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
                  Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
                  NC, {USA}},
  pages        = {393--402},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/TEST.2003.1270863},
  doi          = {10.1109/TEST.2003.1270863},
  timestamp    = {Tue, 17 Oct 2023 15:22:33 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/LiYHWTHC03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}