BibTeX record conf/itc/MadgeBTDSR04

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@inproceedings{DBLP:conf/itc/MadgeBTDSR04,
  author       = {Robert Madge and
                  Brady Benware and
                  Ritesh P. Turakhia and
                  W. Robert Daasch and
                  Chris Schuermyer and
                  Jens Ruffler},
  title        = {In Search of the Optimum Test Set - Adaptive Test Methods for Maximum
                  Defect Coverage and Lowest Test Cost},
  booktitle    = {Proceedings 2004 International Test Conference {(ITC} 2004), October
                  26-28, 2004, Charlotte, NC, {USA}},
  pages        = {203--212},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/TEST.2004.1386954},
  doi          = {10.1109/TEST.2004.1386954},
  timestamp    = {Thu, 23 Mar 2023 23:58:41 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MadgeBTDSR04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}