BibTeX record conf/itc/MalyFS84

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@inproceedings{DBLP:conf/itc/MalyFS84,
  author       = {Wojciech Maly and
                  F. Joel Ferguson and
                  John Paul Shen},
  title        = {Systematic Characterization of Physical Defects for Fault Analysis
                  of {MOS} {IC} Cells},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {390--399},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 13:40:15 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MalyFS84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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