BibTeX record conf/itc/MathewS95

download as .bib file

@inproceedings{DBLP:conf/itc/MathewS95,
  author       = {Ben Mathew and
                  Daniel G. Saab},
  title        = {{DFT} {\&} {ATPG:} Together Again},
  booktitle    = {Proceedings {IEEE} International Test Conference 1995, Driving Down
                  the Cost of Test, Washington, DC, USA, October 21-25, 1995},
  pages        = {262--271},
  publisher    = {{IEEE} Computer Society},
  year         = {1995},
  url          = {https://doi.org/10.1109/TEST.1995.529841},
  doi          = {10.1109/TEST.1995.529841},
  timestamp    = {Thu, 23 Mar 2023 23:58:41 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MathewS95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.