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BibTeX record conf/itc/SavirB83
@inproceedings{DBLP:conf/itc/SavirB83, author = {Jacob Savir and Paul H. Bardell}, title = {On Random Pattern Test Length}, booktitle = {Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983}, pages = {95--107}, publisher = {{IEEE} Computer Society}, year = {1983}, timestamp = {Tue, 05 Nov 2002 15:16:27 +0100}, biburl = {https://dblp.org/rec/conf/itc/SavirB83.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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