BibTeX record conf/itc/SaxenaBW01

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@inproceedings{DBLP:conf/itc/SaxenaBW01,
  author       = {Jayashree Saxena and
                  Kenneth M. Butler and
                  Lee Whetsel},
  title        = {An analysis of power reduction techniques in scan testing},
  booktitle    = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
                  MD, USA, 30 October - 1 November 2001},
  pages        = {670--677},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/TEST.2001.966687},
  doi          = {10.1109/TEST.2001.966687},
  timestamp    = {Thu, 23 Mar 2023 23:58:41 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/SaxenaBW01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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