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BibTeX record conf/itc/WenYMKWSK05
@inproceedings{DBLP:conf/itc/WenYMKWSK05, author = {Xiaoqing Wen and Yoshiyuki Yamashita and Shohei Morishima and Seiji Kajihara and Laung{-}Terng Wang and Kewal K. Saluja and Kozo Kinoshita}, title = {Low-capture-power test generation for scan-based at-speed testing}, booktitle = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005, Austin, TX, USA, November 8-10, 2005}, pages = {10}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/TEST.2005.1584068}, doi = {10.1109/TEST.2005.1584068}, timestamp = {Thu, 23 Mar 2023 23:58:42 +0100}, biburl = {https://dblp.org/rec/conf/itc/WenYMKWSK05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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