BibTeX record conf/itc/WuCLLWTLCPW12

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@inproceedings{DBLP:conf/itc/WuCLLWTLCPW12,
  author       = {Tze{-}Hsin Wu and
                  Po{-}Yuan Chen and
                  Mincent Lee and
                  Bin{-}Yen Lin and
                  Cheng{-}Wen Wu and
                  Chen{-}Hung Tien and
                  Hung{-}Chih Lin and
                  Hao Chen and
                  Ching{-}Nen Peng and
                  Min{-}Jer Wang},
  title        = {A memory yield improvement scheme combining built-in self-repair and
                  error correction codes},
  booktitle    = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
                  USA, November 5-8, 2012},
  pages        = {1--9},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/TEST.2012.6401576},
  doi          = {10.1109/TEST.2012.6401576},
  timestamp    = {Sat, 30 Sep 2023 09:50:58 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/WuCLLWTLCPW12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}