BibTeX record conf/iwsm/TrudelA11

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@inproceedings{DBLP:conf/iwsm/TrudelA11,
  author       = {Sylvie Trudel and
                  Alain Abran},
  editor       = {Koichi Matsuda and
                  Ken{-}ichi Matsumoto and
                  Akito Monden},
  title        = {Bidirectional Influence of Defects and Functional Size},
  booktitle    = {2011 Joint Conf of 21st Int'l Workshop on Software Measurement and
                  the 6th Int'l Conference on Software Process and Product Measurement,
                  IWSM/Mensura 2011, Nara, Japan, November 3-4, 2011},
  pages        = {69--75},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/IWSM-MENSURA.2011.21},
  doi          = {10.1109/IWSM-MENSURA.2011.21},
  timestamp    = {Thu, 23 Mar 2023 23:59:43 +0100},
  biburl       = {https://dblp.org/rec/conf/iwsm/TrudelA11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}