BibTeX record conf/mwscas/LeeD14

download as .bib file

@inproceedings{DBLP:conf/mwscas/LeeD14,
  author       = {David S. Lee and
                  Jeffrey Draper},
  title        = {A framework to quantify {FPGA} design hardness against radiation-induced
                  single event effects},
  booktitle    = {{IEEE} 57th International Midwest Symposium on Circuits and Systems,
                  {MWSCAS} 2014, College Station, TX, USA, August 3-6, 2014},
  pages        = {302--305},
  publisher    = {{IEEE}},
  year         = {2014},
  url          = {https://doi.org/10.1109/MWSCAS.2014.6908412},
  doi          = {10.1109/MWSCAS.2014.6908412},
  timestamp    = {Mon, 09 Aug 2021 14:54:01 +0200},
  biburl       = {https://dblp.org/rec/conf/mwscas/LeeD14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.