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BibTeX record conf/nanoarch/0002CF12
@inproceedings{DBLP:conf/nanoarch/0002CF12, author = {Yao Wang and Sorin Dan Cotofana and Liang Fang}, editor = {Csaba Andras Moritz}, title = {Statistical reliability analysis of {NBTI} impact on FinFET SRAMs and mitigation technique using independent-gate devices}, booktitle = {Proceedings of the 2012 {IEEE/ACM} International Symposium on Nanoscale Architectures, {NANOARCH} 2012, Amsterdam, The Netherlands, July 4-6, 2012}, pages = {109--115}, publisher = {{ACM}}, year = {2012}, url = {https://doi.org/10.1145/2765491.2765512}, doi = {10.1145/2765491.2765512}, timestamp = {Wed, 11 Aug 2021 17:02:31 +0200}, biburl = {https://dblp.org/rec/conf/nanoarch/0002CF12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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