BibTeX record conf/newcas/GalatroS15

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@inproceedings{DBLP:conf/newcas/GalatroS15,
  author    = {L. Galatro and
               M. Spirito},
  title     = {Calibration and characterization techniques for on-wafer device characterization},
  booktitle = {{IEEE} 13th International New Circuits and Systems Conference, {NEWCAS}
               2015, Grenoble, France, June 7-10, 2015},
  pages     = {1--4},
  year      = {2015},
  crossref  = {DBLP:conf/newcas/2015},
  url       = {https://doi.org/10.1109/NEWCAS.2015.7181978},
  doi       = {10.1109/NEWCAS.2015.7181978},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/newcas/GalatroS15},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/newcas/2015,
  title     = {{IEEE} 13th International New Circuits and Systems Conference, {NEWCAS}
               2015, Grenoble, France, June 7-10, 2015},
  publisher = {{IEEE}},
  year      = {2015},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7157844/proceeding},
  isbn      = {978-1-4799-8893-8},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/newcas/2015},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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