BibTeX record conf/seke/GaoKF08

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@inproceedings{DBLP:conf/seke/GaoKF08,
  author       = {Jerry Gao and
                  Karen Kwok and
                  Todd Fitch},
  title        = {Model-based Test Complexity Analysis for Software Installation Testing},
  booktitle    = {Proceedings of the Twentieth International Conference on Software
                  Engineering {\&} Knowledge Engineering (SEKE'2008), San Francisco,
                  CA, USA, July 1-3, 2008},
  pages        = {631--637},
  publisher    = {Knowledge Systems Institute Graduate School},
  year         = {2008},
  timestamp    = {Wed, 21 Jun 2023 16:54:56 +0200},
  biburl       = {https://dblp.org/rec/conf/seke/GaoKF08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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