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BibTeX record conf/seke/JingZL17
@inproceedings{DBLP:conf/seke/JingZL17, author = {Yiyang Jing and Jiansheng Zhang and Jin Liu}, editor = {Xudong He}, title = {Is the Number of Faults Helpful for Cross-Company Defect Prediction?}, booktitle = {The 29th International Conference on Software Engineering and Knowledge Engineering, Wyndham Pittsburgh University Center, Pittsburgh, PA, USA, July 5-7, 2017}, pages = {111--116}, publisher = {{KSI} Research Inc. and Knowledge Systems Institute Graduate School}, year = {2017}, url = {https://doi.org/10.18293/SEKE2017-034}, doi = {10.18293/SEKE2017-034}, timestamp = {Wed, 03 Feb 2021 08:31:33 +0100}, biburl = {https://dblp.org/rec/conf/seke/JingZL17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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