BibTeX record conf/sigmetrics/SchmidCFCS08

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@inproceedings{DBLP:conf/sigmetrics/SchmidCFCS08,
  author       = {Thomas Schmid and
                  Zainul Charbiwala and
                  Jonathan Friedman and
                  Young H. Cho and
                  Mani B. Srivastava},
  editor       = {Zhen Liu and
                  Vishal Misra and
                  Prashant J. Shenoy},
  title        = {Exploiting manufacturing variations for compensating environment-induced
                  clock drift in time synchronization},
  booktitle    = {Proceedings of the 2008 {ACM} {SIGMETRICS} International Conference
                  on Measurement and Modeling of Computer Systems, {SIGMETRICS} 2008,
                  Annapolis, MD, USA, June 2-6, 2008},
  pages        = {97--108},
  publisher    = {{ACM}},
  year         = {2008},
  url          = {https://doi.org/10.1145/1375457.1375469},
  doi          = {10.1145/1375457.1375469},
  timestamp    = {Fri, 30 Jul 2021 16:13:32 +0200},
  biburl       = {https://dblp.org/rec/conf/sigmetrics/SchmidCFCS08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}