BibTeX record conf/sspr/DarwicheRCT18

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@inproceedings{DBLP:conf/sspr/DarwicheRCT18,
  author       = {Mostafa Darwiche and
                  Romain Raveaux and
                  Donatello Conte and
                  Vincent T'kindt},
  editor       = {Xiao Bai and
                  Edwin R. Hancock and
                  Tin Kam Ho and
                  Richard C. Wilson and
                  Battista Biggio and
                  Antonio Robles{-}Kelly},
  title        = {Graph Edit Distance in the Exact Context},
  booktitle    = {Structural, Syntactic, and Statistical Pattern Recognition - Joint
                  {IAPR} International Workshop, {S+SSPR} 2018, Beijing, China, August
                  17-19, 2018, Proceedings},
  series       = {Lecture Notes in Computer Science},
  volume       = {11004},
  pages        = {304--314},
  publisher    = {Springer},
  year         = {2018},
  url          = {https://doi.org/10.1007/978-3-319-97785-0\_29},
  doi          = {10.1007/978-3-319-97785-0\_29},
  timestamp    = {Mon, 26 Jun 2023 20:47:53 +0200},
  biburl       = {https://dblp.org/rec/conf/sspr/DarwicheRCT18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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