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BibTeX record conf/sspr/DarwicheRCT18
@inproceedings{DBLP:conf/sspr/DarwicheRCT18, author = {Mostafa Darwiche and Romain Raveaux and Donatello Conte and Vincent T'kindt}, editor = {Xiao Bai and Edwin R. Hancock and Tin Kam Ho and Richard C. Wilson and Battista Biggio and Antonio Robles{-}Kelly}, title = {Graph Edit Distance in the Exact Context}, booktitle = {Structural, Syntactic, and Statistical Pattern Recognition - Joint {IAPR} International Workshop, {S+SSPR} 2018, Beijing, China, August 17-19, 2018, Proceedings}, series = {Lecture Notes in Computer Science}, volume = {11004}, pages = {304--314}, publisher = {Springer}, year = {2018}, url = {https://doi.org/10.1007/978-3-319-97785-0\_29}, doi = {10.1007/978-3-319-97785-0\_29}, timestamp = {Mon, 26 Jun 2023 20:47:53 +0200}, biburl = {https://dblp.org/rec/conf/sspr/DarwicheRCT18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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