BibTeX record conf/vlsi-dat/LeeTW18

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@inproceedings{DBLP:conf/vlsi-dat/LeeTW18,
  author       = {Yen{-}Lin Lee and
                  Pei{-}Kuei Tsung and
                  Max Wu},
  title        = {Techology trend of edge {AI}},
  booktitle    = {2018 International Symposium on {VLSI} Design, Automation and Test
                  (VLSI-DAT), Hsinchu, Taiwan, April 16-19, 2018},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/VLSI-DAT.2018.8373244},
  doi          = {10.1109/VLSI-DAT.2018.8373244},
  timestamp    = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl       = {https://dblp.org/rec/conf/vlsi-dat/LeeTW18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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