BibTeX record conf/vts/AnghelNA00

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@inproceedings{DBLP:conf/vts/AnghelNA00,
  author    = {Lorena Anghel and
               Michael Nicolaidis and
               Issam Alzaher{-}Noufal},
  title     = {Self-Checking Circuits versus Realistic Faults in Very Deep Submicron},
  booktitle = {18th {IEEE} {VLSI} Test Symposium {(VTS} 2000), 30 April - 4 May 2000,
               Montreal, Canada},
  pages     = {55--66},
  year      = {2000},
  crossref  = {DBLP:conf/vts/2000},
  url       = {https://doi.org/10.1109/VTEST.2000.843827},
  doi       = {10.1109/VTEST.2000.843827},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/AnghelNA00},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vts/2000,
  title     = {18th {IEEE} {VLSI} Test Symposium {(VTS} 2000), 30 April - 4 May 2000,
               Montreal, Canada},
  publisher = {{IEEE} Computer Society},
  year      = {2000},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6812/proceeding},
  isbn      = {0-7695-0613-5},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/2000},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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