BibTeX record conf/vts/CampbellKLMNO96

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@inproceedings{DBLP:conf/vts/CampbellKLMNO96,
  author       = {R. L. Campbell and
                  P. Kuekes and
                  David Y. Lepejian and
                  Wojciech P. Maly and
                  Michael Nicolaidis and
                  Alex Orailoglu},
  title        = {Can Defect-Tolerant Chips Better Meet the Quality Challenge?},
  booktitle    = {14th {IEEE} {VLSI} Test Symposium (VTS'96), April 28 - May 1, 1996,
                  Princeton, NJ, {USA}},
  pages        = {362--363},
  publisher    = {{IEEE} Computer Society},
  year         = {1996},
  url          = {https://doi.ieeecomputersociety.org/10.1109/VTS.1996.10016},
  doi          = {10.1109/VTS.1996.10016},
  timestamp    = {Fri, 24 Mar 2023 00:04:05 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/CampbellKLMNO96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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