BibTeX record conf/vts/CampbellKLMNO96

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@inproceedings{DBLP:conf/vts/CampbellKLMNO96,
  author    = {R. L. Campbell and
               P. Kuekes and
               David Y. Lepejian and
               Wojciech P. Maly and
               Michael Nicolaidis and
               Alex Orailoglu},
  title     = {Can Defect-Tolerant Chips Better Meet the Quality Challenge?},
  booktitle = {14th {IEEE} {VLSI} Test Symposium (VTS'96), April 28 - May 1, 1996,
               Princeton, NJ, {USA}},
  pages     = {362--363},
  year      = {1996},
  crossref  = {DBLP:conf/vts/1996},
  url       = {http://doi.ieeecomputersociety.org/10.1109/VTS.1996.10016},
  doi       = {10.1109/VTS.1996.10016},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/CampbellKLMNO96},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vts/1996,
  title     = {14th {IEEE} {VLSI} Test Symposium (VTS'96), April 28 - May 1, 1996,
               Princeton, NJ, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {1996},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/3739/proceeding},
  isbn      = {0-8186-7304-4},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/1996},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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