BibTeX record conf/vts/ChampacF95

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@inproceedings{DBLP:conf/vts/ChampacF95,
  author       = {V{\'{\i}}ctor H. Champac and
                  Joan Figueras},
  title        = {Testability of floating gate defects in sequential circuits},
  booktitle    = {13th {IEEE} {VLSI} Test Symposium (VTS'95), April 30 - May 3, 1995,
                  Princeton, New Jersey, {USA}},
  pages        = {202--207},
  publisher    = {{IEEE} Computer Society},
  year         = {1995},
  url          = {https://doi.org/10.1109/VTEST.1995.512638},
  doi          = {10.1109/VTEST.1995.512638},
  timestamp    = {Fri, 24 Mar 2023 00:04:04 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/ChampacF95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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