BibTeX record conf/vts/Chau93

download as .bib file

@inproceedings{DBLP:conf/vts/Chau93,
  author       = {Savio N. Chau},
  title        = {Fault injection scan design for enhanced {VLSI} design verification},
  booktitle    = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
                  Atlantic City, NJ, {USA}},
  pages        = {109--111},
  publisher    = {{IEEE} Computer Society},
  year         = {1993},
  url          = {https://doi.org/10.1109/VTEST.1993.313299},
  doi          = {10.1109/VTEST.1993.313299},
  timestamp    = {Fri, 24 Mar 2023 00:04:04 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/Chau93.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.