BibTeX record conf/vts/GaoBOO19

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@inproceedings{DBLP:conf/vts/GaoBOO19,
  author       = {Hang Gao and
                  Ganapati Bhat and
                  {\"{U}}mit Y. Ogras and
                  Sule Ozev},
  title        = {Optimized Stress Testing for Flexible Hybrid Electronics Designs},
  booktitle    = {37th {IEEE} {VLSI} Test Symposium, {VTS} 2019, Monterey, CA, USA,
                  April 23-25, 2019},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/VTS.2019.8758661},
  doi          = {10.1109/VTS.2019.8758661},
  timestamp    = {Mon, 05 Feb 2024 20:29:48 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/GaoBOO19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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