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BibTeX record conf/vts/HouarcheCRCEPB09
@inproceedings{DBLP:conf/vts/HouarcheCRCEPB09, author = {Nicolas Houarche and Mariane Comte and Michel Renovell and Alejandro Czutro and Piet Engelke and Ilia Polian and Bernd Becker}, title = {An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects}, booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa Cruz, California, {USA}}, pages = {21--26}, publisher = {{IEEE} Computer Society}, year = {2009}, url = {https://doi.org/10.1109/VTS.2009.57}, doi = {10.1109/VTS.2009.57}, timestamp = {Fri, 24 Mar 2023 00:04:04 +0100}, biburl = {https://dblp.org/rec/conf/vts/HouarcheCRCEPB09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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