BibTeX record conf/vts/HsuKCCCC13

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@inproceedings{DBLP:conf/vts/HsuKCCCC13,
  author       = {Hao{-}Wen Hsu and
                  Shih{-}Hua Kuo and
                  Wen{-}Hsiang Chang and
                  Shi{-}Hao Chen and
                  Ming{-}Tung Chang and
                  Mango Chia{-}Tso Chao},
  title        = {Testing retention flip-flops in power-gated designs},
  booktitle    = {31st {IEEE} {VLSI} Test Symposium, {VTS} 2013, Berkeley, CA, USA,
                  April 29 - May 2, 2013},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2013},
  url          = {https://doi.org/10.1109/VTS.2013.6548880},
  doi          = {10.1109/VTS.2013.6548880},
  timestamp    = {Fri, 24 Mar 2023 00:04:04 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/HsuKCCCC13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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