BibTeX record conf/vts/Nicolaidis99

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@inproceedings{DBLP:conf/vts/Nicolaidis99,
  author    = {Michael Nicolaidis},
  title     = {Time Redundancy Based Soft-Error Tolerance to Rescue Nanometer Technologies},
  booktitle = {17th {IEEE} {VLSI} Test Symposium {(VTS} '99), 25-30 April 1999, San
               Diego, CA, {USA}},
  pages     = {86--94},
  year      = {1999},
  crossref  = {DBLP:conf/vts/1999},
  url       = {https://doi.org/10.1109/VTEST.1999.766651},
  doi       = {10.1109/VTEST.1999.766651},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/Nicolaidis99},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/vts/1999,
  title     = {17th {IEEE} {VLSI} Test Symposium {(VTS} '99), 25-30 April 1999, San
               Diego, CA, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {1999},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6209/proceeding},
  isbn      = {0-7695-0146-X},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/1999},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}