BibTeX record conf/vts/RajanLA96

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@inproceedings{DBLP:conf/vts/RajanLA96,
  author       = {Krishna B. Rajan and
                  David E. Long and
                  Miron Abramovici},
  title        = {Increasing testability by clock transformation (getting rid of those
                  darn states)},
  booktitle    = {14th {IEEE} {VLSI} Test Symposium (VTS'96), April 28 - May 1, 1996,
                  Princeton, NJ, {USA}},
  pages        = {224--230},
  publisher    = {{IEEE} Computer Society},
  year         = {1996},
  url          = {https://doi.org/10.1109/VTEST.1996.510861},
  doi          = {10.1109/VTEST.1996.510861},
  timestamp    = {Fri, 24 Mar 2023 00:04:04 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/RajanLA96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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