BibTeX record conf/vts/ShiHD10

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@inproceedings{DBLP:conf/vts/ShiHD10,
  author       = {Yiwen Shi and
                  Wan{-}Chan Hu and
                  Jennifer Dworak},
  title        = {Too many faults, too little time on creating test sets for enhanced
                  detection of highly critical faults and defects},
  booktitle    = {28th {IEEE} {VLSI} Test Symposium, {VTS} 2010, April 19-22, 2010,
                  Santa Cruz, California, {USA}},
  pages        = {319--324},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/VTS.2010.5469545},
  doi          = {10.1109/VTS.2010.5469545},
  timestamp    = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/ShiHD10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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