BibTeX record conf/vts/TsaiLLYLHCKLC16

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@inproceedings{DBLP:conf/vts/TsaiLLYLHCKLC16,
  author       = {Chih{-}Ying Tsai and
                  Kao{-}Chi Lee and
                  Chien{-}Hsueh Lin and
                  Sung{-}Chu Yu and
                  Wen{-}Rong Liau and
                  Alex Chun{-}Liang Hou and
                  Ying{-}Yen Chen and
                  Chun{-}Yi Kuo and
                  Jih{-}Nung Lee and
                  Mango C.{-}T. Chao},
  title        = {Predicting Vt mean and variance from parallel Id measurement with
                  model-fitting technique},
  booktitle    = {34th {IEEE} {VLSI} Test Symposium, {VTS} 2016, Las Vegas, NV, USA,
                  April 25-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2016},
  url          = {https://doi.org/10.1109/VTS.2016.7477268},
  doi          = {10.1109/VTS.2016.7477268},
  timestamp    = {Fri, 24 Mar 2023 00:04:05 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/TsaiLLYLHCKLC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}