BibTeX record conf/vts/TurakhiaBMSD05

download as .bib file

@inproceedings{DBLP:conf/vts/TurakhiaBMSD05,
  author       = {Ritesh P. Turakhia and
                  Brady Benware and
                  Robert Madge and
                  Thaddeus T. Shannon and
                  W. Robert Daasch},
  title        = {Defect Screening Using Independent Component Analysis on I{\_}DDQ},
  booktitle    = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
                  Springs, CA, {USA}},
  pages        = {427--432},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/VTS.2005.38},
  doi          = {10.1109/VTS.2005.38},
  timestamp    = {Sat, 30 Sep 2023 09:58:40 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/TurakhiaBMSD05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics