BibTeX record journals/et/ChakravartyGV96

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@article{DBLP:journals/et/ChakravartyGV96,
  author       = {Sreejit Chakravarty and
                  Yiming Gong and
                  Srikanth Venkataraman},
  title        = {Diagnostic simulation of stuck-at faults in combinational circuits},
  journal      = {J. Electron. Test.},
  volume       = {8},
  number       = {1},
  pages        = {87--97},
  year         = {1996},
  url          = {https://doi.org/10.1007/BF00136078},
  doi          = {10.1007/BF00136078},
  timestamp    = {Fri, 11 Sep 2020 15:03:09 +0200},
  biburl       = {https://dblp.org/rec/journals/et/ChakravartyGV96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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