BibTeX record journals/et/KimKH08

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@article{DBLP:journals/et/KimKH08,
  author       = {Hong{-}Sik Kim and
                  Sungho Kang and
                  Michael S. Hsiao},
  title        = {A New Scan Architecture for Both Low Power Testing and Test Volume
                  Compression Under {SOC} Test Environment},
  journal      = {J. Electron. Test.},
  volume       = {24},
  number       = {4},
  pages        = {365--378},
  year         = {2008},
  url          = {https://doi.org/10.1007/s10836-008-5062-6},
  doi          = {10.1007/S10836-008-5062-6},
  timestamp    = {Tue, 27 Feb 2024 16:41:39 +0100},
  biburl       = {https://dblp.org/rec/journals/et/KimKH08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}