BibTeX record journals/ieiceee/SonKK17a

download as .bib file

@article{DBLP:journals/ieiceee/SonKK17a,
  author       = {Younghwan Son and
                  Yoon Kim and
                  Myounggon Kang},
  title        = {Characterization of oxide trap density with the charge pumping technique
                  in dual-layer gate oxide},
  journal      = {{IEICE} Electron. Express},
  volume       = {14},
  number       = {8},
  pages        = {20170141},
  year         = {2017},
  url          = {https://doi.org/10.1587/elex.14.20170141},
  doi          = {10.1587/ELEX.14.20170141},
  timestamp    = {Fri, 12 Feb 2021 22:21:44 +0100},
  biburl       = {https://dblp.org/rec/journals/ieiceee/SonKK17a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.