BibTeX record journals/ieicet/LeeYSS08

download as .bib file

@article{DBLP:journals/ieicet/LeeYSS08,
  author       = {Hochul Lee and
                  Youngchang Yoon and
                  Ickhyun Song and
                  Hyungcheol Shin},
  title        = {{FN} Stress Induced Degradation on Random Telegraph Signal Noise in
                  Deep Submicron NMOSFETs},
  journal      = {{IEICE} Trans. Electron.},
  volume       = {91-C},
  number       = {5},
  pages        = {776--779},
  year         = {2008},
  url          = {https://doi.org/10.1093/ietele/e91-c.5.776},
  doi          = {10.1093/IETELE/E91-C.5.776},
  timestamp    = {Sat, 11 Apr 2020 14:47:48 +0200},
  biburl       = {https://dblp.org/rec/journals/ieicet/LeeYSS08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.