BibTeX record journals/mr/BuiuHERLHC07

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@article{DBLP:journals/mr/BuiuHERLHC07,
  author       = {Octavian Buiu and
                  Steve Hall and
                  Olof Engstr{\"{o}}m and
                  B. Raeissi and
                  Max C. Lemme and
                  Paul K. Hurley and
                  Karim Cherkaoui},
  title        = {Extracting the relative dielectric constant for "high-kappa layers"
                  from {CV} measurements - Errors and error propagation},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {4-5},
  pages        = {678--681},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.01.006},
  doi          = {10.1016/J.MICROREL.2007.01.006},
  timestamp    = {Thu, 14 Oct 2021 09:38:46 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/BuiuHERLHC07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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