Stop the war!
Остановите войну!
for scientists:
default search action
BibTeX record journals/mr/HuardDPRPBV05
@article{DBLP:journals/mr/HuardDPRPBV05, author = {Vincent Huard and M. Denais and F. Perrier and Nathalie Revil and C. R. Parthasarathy and Alain Bravaix and E. Vincent}, title = {A thorough investigation of MOSFETs {NBTI} degradation}, journal = {Microelectron. Reliab.}, volume = {45}, number = {1}, pages = {83--98}, year = {2005}, url = {https://doi.org/10.1016/j.microrel.2004.04.027}, doi = {10.1016/J.MICROREL.2004.04.027}, timestamp = {Sat, 30 Sep 2023 10:21:33 +0200}, biburl = {https://dblp.org/rec/journals/mr/HuardDPRPBV05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.