BibTeX record journals/mr/HuardDPRPBV05

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@article{DBLP:journals/mr/HuardDPRPBV05,
  author       = {Vincent Huard and
                  M. Denais and
                  F. Perrier and
                  Nathalie Revil and
                  C. R. Parthasarathy and
                  Alain Bravaix and
                  E. Vincent},
  title        = {A thorough investigation of MOSFETs {NBTI} degradation},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {1},
  pages        = {83--98},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2004.04.027},
  doi          = {10.1016/J.MICROREL.2004.04.027},
  timestamp    = {Sat, 30 Sep 2023 10:21:33 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/HuardDPRPBV05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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