BibTeX record journals/mr/IlleSPGBERACGB09

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@article{DBLP:journals/mr/IlleSPGBERACGB09,
  author       = {Adrien Ille and
                  Wolfgang Stadler and
                  Thomas Pompl and
                  Harald Gossner and
                  Tilo Brodbeck and
                  Kai Esmark and
                  Philipp Riess and
                  David Alvarez and
                  Kiran V. Chatty and
                  Robert Gauthier and
                  Alain Bravaix},
  title        = {Reliability aspects of gate oxide under {ESD} pulse stress},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {12},
  pages        = {1407--1416},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2009.06.054},
  doi          = {10.1016/J.MICROREL.2009.06.054},
  timestamp    = {Sat, 30 Sep 2023 10:21:33 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/IlleSPGBERACGB09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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