BibTeX record journals/mr/LeeB18

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@article{DBLP:journals/mr/LeeB18,
  author       = {Hosung Lee and
                  Sanghyeon Baeg},
  title        = {Signal characteristic and test exploitation for intermittent nanometer-scale
                  cracks},
  journal      = {Microelectron. Reliab.},
  volume       = {84},
  pages        = {26--36},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.03.001},
  doi          = {10.1016/J.MICROREL.2018.03.001},
  timestamp    = {Sat, 25 Dec 2021 15:52:15 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LeeB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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